Search results for "dynamic test"
showing 10 items of 18 documents
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
2020
International audience; In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.
A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing
2015
A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.
Simultaneous measurement of temperature and strain in glass fiber/epoxy composites by embedded fiber optic sensors: II. Post-cure testing
2007
In this paper the use of fiber optic sensors embedded into GFRP laminates for structural health monitoring of thermo-mechanical loads is presented. The proposed sensing system, consisting of two coupled fiber Bragg grating (FBG) sensors, allows the simultaneous measurement of both temperature and strain by decoupling the change in reflected wavelength induced by temperature variations from that induced by either mechanical or apparent strain, with significant advantages either for monitoring the composite cure kinetics, as described in the accompanying paper (Part I), or for assessing the structural response to thermo-mechanical loads. Both thermal ramp and mechanical static/dynamic bending…
A new large scale laboratory: The LEDA research centre (Laboratory of Earthquake engineering and Dynamic Analysis)
2017
Recently, the field of earthquake engineering experienced substantial enhancements due to numerous results of experimental and theoretical researches. Modern technical codes recognized the last advances in this field and provided new solutions for the structural assessment and design of buildings. However, the need for large scale testing is still taking several open questions, especially for the design of civil infrastructures, and experimental activity on full scale specimens has become necessary. This paper presents the main testing facilities of a new research centre, namely the Laboratory of Earthquake engineering and Dynamic Analysis (LEDA) of the University of Enna “Kore”. In particu…
Misura delle vibrazioni sul simulacro argenteo dell'Immacolata processione
2011
The reaction structure of the LEDA research centre: Development and design
2017
In the last twenty years, the field of earthquake engineering experienced a noticeable improvement. The results of experimental and theoretical researches have contributed to the development of modern technical codes, which provide innovative solutions for the structural assessment and new design approaches. Despite this large amount of improvements, several open questions are still open, and the need for large scale testing has been deeply proved and discussed. A new research facility, namely the Laboratory of Earthquake engineering and Dynamic Analysis (LEDA), has been recently completed at the University of Enna "Kore". This research centre, funded with a grant from Italian Ministry of E…
Frequency domain identification of the fractional Kelvin-Voigt’s parameters for viscoelastic materials
2019
Abstract In this work, a new innovative method is used to identify the parameters of fractional Kelvin-Voigt constitutive equation. These parameters are: the order of fractional derivation operator, 0 ≤ α ≤ 1, the coefficient of fractional derivation operator, CV, and the stiffness of the model, KV. A particular dynamic test setup is developed to capture the experimental data. Its outputs are time histories of the excitation and excited accelerations. The investigated specimen is a polymeric cubic silicone gel material known as α-gel. Two kinds of experimental excitations are used as random frequencies and constant frequency harmonic excitations. In this study, experimental frequency respon…
Neutron-Induced Effects on a Self-Refresh DRAM
2022
International audience; The field of radiation effects in electronics research includes unknowns for every new device, node size, and technical development. In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under neutron irradiation. The neutron-induced effects were investigated and characterised by event cross sections, soft-error rate, and bitmaps evaluations, leading to an identification of permanent and temporary stuck cells, single-bit upsets, and block errors. Block errors were identified in different patterns with dependency in the addressing order, leading to up to two thousand faulty words per event, representing a real threat fr…
Soft errors in commercial off-the-shelf static random access memories
2016
International audience; This article reviews state-of-the-art techniques for the evaluation of the effect of radiation on static random access memory (SRAM). We detailed irradiation test techniques and results from irradiation experiments with several types of particles. Two commercial SRAMs, in 90 and 65 nm technology nodes, were considered as case studies. Besides the basic static and dynamic test modes, advanced stimuli for the irradiation tests were introduced, as well as statistical post-processing techniques allowing for deeper analysis of the correlations between bit-flip cross-sections and design/architectural characteristics of the memory device. Further insight is provided on the …
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory
2018
International audience; This paper identifies the failure modes of a commercial 130-nm ferroelectric random access memory. The devices were irradiated with heavy-ion and pulsed focused X-ray beams. Various failure modes are observed, which generate characteristic error patterns, affecting isolated bits, words, groups of pages, and sometimes entire regions of the memory array. The underlying mechanisms are discussed.